Measurement and analysis |
Markery |
Vertical bars, horizontal bars (measure volts) alebo waveform markers |
Automatické merania |
Do 10 naraz |
Merania, X parametre |
Period, frequency, pos/neg width, rise/fall time, pos/neg duty cycle, pos/neg crossing, burst width, cycles, time at max/min, pos/neg jitter ppm/RMS |
Merania, Y parametre |
Max, min, top, base, peak-peak, amplitude, middle, mean, cycle mean, AC/DC RMS, cycle AC/DC RMS, pos/neg overshoot, area, cycle area |
Merania, trace-to-trace |
Delay 1R-1R, delay 1F-1R, delay 1R-nR, delay 1F-nR, delay 1R-1F, delay 1F-1F, delay 1R-nF, delay 1F-nF, phase deg/rad/%, gain, gain dB |
Eye measurements, X NRZ |
Area, bit rate, bit time, crossing time, cycle area, duty cycle distortion abs/%, eye width abs/%, rise/fall time, frequency, period, jitter p-p/RMS |
Eye measurements, Y NRZ |
AC RMS, average power lin/dB, crossing %/level, extinction ratio dB/%/lin, eye amplitude, eye height lin/dB, max/min, mean, middle, pos/neg overshoot, noise p-p/RMS one/zero level, p-p, RMS, S/N ratio lin/dB. |
Eye measurements, X RZ |
Area, bit rate/time, cycle area, eye width abs/%, rise/fall time, jitter p-p/RMS fall/rise, neg/pos crossing, pos duty cycle, pulse symmetry, pulse width |
Eye measurements, Y RZ |
AC RMS, average power lin/dB, contrast ratio lin/dB/%, extinction ratio lin/dB/%, eye amplitude, eye high lin/dB, eye opening, max, min, mean, middle, noise p-p/RMS one/zero, one/zero level, peak-peak, RMS, S/N |
Histogram |
Vertical alebo horizontal |